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AFMinSEM Part 1 - with active cantilever from nano analytik GmbH
AFMinSEM Part 2 - 5 minute installation
AFMinSEM Part 3 - MEMS characterization and nanomanipulation
AFMinSEM Part 4 - review from nano analytik GmbH
Active cantilever oscillating in SEM
nano analytik GmbH - Active Cantilevers Diamond Tip
SII - System for Single Ion Implantation based on active Cantilever

AutoMETRONOM
Active cantilever oscillating in SEM
nano analytik GmbH - Active Cantilevers Diamond Tip
nanoMETRONOM system from nano analytik GmbH
ACA Active Cantilever Array

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nanoMETRONOM

Easiest handling

Easiest probe exchange

Exceptional speed

AFMinSEM

Correlative microscopy

Correlative nanofabrication

in-situ 3D analysis

Scanning Probe Lithography (SPL)

High Resolution Lithography

Mix & Match Lithography

Multi-Plattform UHV System – AFM-MPS

Combines many tools

Flexible configuration

Surface analysis and manipulation

Single-Dopant Lithography – AFM-SDL

Ultra compact UHV-AFM with active cantilevers

Precise navigation and dopant placement

TB-EBID and FE-SPL

AFM Cantilever

Piezoresistive readout

"Plug & Play" cantilever

ADDRESS & CONTACT

nano analytik GmbH
Ehrenbergstraße 3, 98693 Ilmenau

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