Videos

This video is showing the fast installation of nano analytik's AFMinSEM system into a FIB/SEM system.

This video is presenting the capabilities of the nano analytik GmbH AFM integrated into SEM for MEMS characterization and nanomanipulation.

This video shows one of nano analytik GmbH's active cantilevers with thermal actuation and piezoresistive readout, imaged with a scanning electron microscope. The resonant frequency of this cantilever is around 45 kHz.

New Active Cantilevers with single crystal Diamond Tip (AC-DT) from nano analytik GmbH

- Integrated read-out offering sub-0.1nm z-resolution;
- Integrated thermomechanical actuator for noncontact mode;
- Robust Diamond tip with extreme hardness (diamond is known as the “world’s hardest material”);
- Extremely wear resistant;
- Long-Life due to extreme wear and strength resistant tip;
- Excellent imaging resolution in contact/non-contact mode;
- Extremely high elastic modulus (Young's Modulus);
- Extremely stable imaging quality on hard surfaces;
- The diamond tips are electrically conductive;
- Extremely stable Field-Emission Scanning Probe Lithography;
- High capability for quality control and metrology;
- Chemically stable and inert.

This video shows one of nano analytik GmbH's active cantilevers with thermal actuation and piezoresistive readout, imaged with a scanning electron microscope. The resonant frequency of this cantilever is around 45 kHz.

New Active Cantilevers with single crystal Diamond Tip (AC-DT) from nano analytik GmbH

- Integrated read-out offering sub-0.1nm z-resolution;
- Integrated thermomechanical actuator for noncontact mode;
- Robust Diamond tip with extreme hardness (diamond is known as the “world’s hardest material”);
- Extremely wear resistant;
- Long-Life due to extreme wear and strength resistant tip;
- Excellent imaging resolution in contact/non-contact mode;
- Extremely high elastic modulus (Young's Modulus);
- Extremely stable imaging quality on hard surfaces;
- The diamond tips are electrically conductive;
- Extremely stable Field-Emission Scanning Probe Lithography;
- High capability for quality control and metrology;
- Chemically stable and inert.

AFM system from nano analytik GmbH, based on active cantilever technology. The used cantilever feature an integrated actuation and readout.