Request a Quote
Home
Products
Products
Systems
Systems
nanoMETRONOM
AFMinSEM
Scanning Probe Lithography (SPL)
Single-Dopant Lithography – AFM-SDL
Multi-Plattform UHV System – AFM-MPS
Probes
Probes
AFM Cantilever
Controller
Controller
Kronos-Controller
Services
About
About
Technology
About us
News
Projects
Media
Media
Videos
Gallerie
Publications
Careers
Contact
Systems
nanoMETRONOM
Easiest handling
Easiest probe exchange
Exceptional speed
AFMinSEM
Correlative microscopy
Correlative nanofabrication
in-situ 3D analysis
Scanning Probe Lithography (SPL)
High Resolution Lithography
Mix & Match Lithography
Step & Repeat
Multi-Plattform UHV System – AFM-MPS
Combines many tools
Flexible configuration
Surface analysis and manipulation
Single-Dopant Lithography – AFM-SDL
Ultra compact UHV-AFM with active cantilevers
Precise navigation and dopant placement
TB-EBID and FE-SPL
