Contact | Disclaimer | Imprint
© 2010 nano analytik GmbH, Ehrenbergstr. 1 - 98693 Ilmenau - Germany
Phone +49 (0)3677/4690 112 - firstname.lastname@example.org
For the highest productivity of our AFM-Systems, the cantilevers are manually exchangeable in less than 10 sec.
A fast approach technology allows a tip-to-sample approach time of approximately 5 seconds from more than 2 mm above the sample surface and an imaging time of less than 20 seconds.
Scanning speeds of 100 l/sec. (10 µm x 10 µm scan area, 50 nm topography height and 256 pixels/line) are routinely achieved using a novel adaptive scan speed control.
Home / Products