Correlative Microscopy and Nanofabrication with AFM Integrated with SEM

Mathias Holz, Frances I. Allen, Christoph Reuter, Ahmad Ahmad, Martin Hofmann, Alexander Reum, Tzvetan Ivanov, and Ivo W. Rangelow

Microscopy Today, Volume 27, Issue 6, November 2019 , pp. 24-30

DOI: 10.1017/S1551929519001068