We proudly announce the start of the EU project "MetExSPM". The goal is to use high-speed scanning probe microscopy for tracing localized functional properties. Prospectively this will increase productivity and reduce waste in industrial semi-conductor production and related branches. So far, those techniques lacked either throughput or accuracy. This project will strive to overcome these limitations and eventually present a working prototype.

It is a joint research programme of several European partners, nano analytik GmbH one of them, within the frame of the European Metrology Research Programme EMPIR.


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